A New First-Scan Method for Two-Scan Labeling Algorithms
نویسندگان
چکیده
منابع مشابه
A New First-Scan Method for Two-Scan Labeling Algorithms
This paper proposes a new first-scan method for two-scan labeling algorithms. In the first scan, our proposed method first scans every fourth image line, and processes the scan line and its two neighbor lines. Then, it processes the remaining lines from top to bottom one by one. Our method decreases the average number of times that must be checked to process a foreground pixel will; thus, the e...
متن کاملAn efficient first-scan method for label-equivalence-based labeling algorithms
Label-equivalence-based connected-component labeling algorithms complete labeling in two or more raster scans. In the first scan, each foreground pixel is assigned a provisional label, and label equivalences between provisional labels are recorded. For doing this task, all conventional algorithms use the same mask that consists of four processed neighbor pixels to process every foreground pixel...
متن کاملA New Method for Metal Artifact Reduction in CT Scan Images
Introduction In CT imaging, metallic implants inside the tissues cause metal artifact that reduce the quality of image for diagnosis. In order to reduce the effect of this artifact, a new method with more appropriate results has been presented in this research work. Materials and Methods The presented method comprised of following steps: a) image enhancement and metal areas extraction, b) sinog...
متن کاملF-Scan: A DFT Method for Functional Scan at RTL
Due to the difficulty of test pattern generation for sequential circuits, several design-for-testability (DFT) approaches have been proposed. An improvement to these current approaches is needed to cater to the requirements of today’s more complicated chips. This paper introduces a new DFT method applicable to high-level description of circuits, which optimally utilizes existing functional elem...
متن کاملScan-chain Optimization Algorithms for Multiple Scan-paths
| This paper presents an algorithm framework for the scan-chain optimization problem in multiple-scan design methodology. It also presents algorithms we propose based on the framework; these are the rst algorithms ever proposed for multiplescan designing. Experiments using actual design data show that, for ten scan-paths, our algorithms achieved a 90% reduction in scan-test time at the expense ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEICE Transactions on Information and Systems
سال: 2012
ISSN: 0916-8532,1745-1361
DOI: 10.1587/transinf.e95.d.2142